2025-04-16
This product belongs to the category of connectors and interconnect devices, featuring a 20-position double-row (2 rows, 10 positions per row) configuration, with a pin pitch of 1.00mm and a row spaci...
2025-04-16
This product is a socket type connector and interconnect device, adopting a female-shaped socket design, with an 8-position double-row configuration (4 positions per row), pin pitch and row pitch both...
2025-04-16
This product is a socket type connector, featuring a female-shaped socket design with a 30-position double-row configuration (15 positions per row), pin pitch of 1.00mm, and row spacing of 2.66mm. The...
2025-04-16
This product is of plug type, adopting a male-shaped pin design, with an 8-bit double-row configuration (4 pins per row), with a pitch and row spacing of 2.50mm, featuring a compact layout, facilitati...
2025-04-16
This product is a socket type connector, featuring a female-shaped socket design with an 8-position double-row configuration (4 positions per row). The pin pitch and row spacing are both 4.20mm, suita...
2025-04-15
The 245015064100863 connector adopts a 1.00mm pitch double-row design and supports various joint stacking heights (8mm, 10mm, 13mm, 15mm), providing flexible options for different structural requireme...
2025-04-15
The 145655040000829+T connector uses a 0.50mm pitch, dual-row pin layout, suitable for various applications such as data transmission and power connection.
2025-04-15
The 245655030700829+T connector adopts a 0.50mm pitch, dual-row array design, which can achieve efficient data and power transmission in a limited space and is suitable for various compact electronic ...
2025-04-15
The 245655050400829+T connector uses a 0.50mm pitch double-row arrangement, with a mating stack height of 4mm and a board height of only 2.75mm, making it suitable for compact designs in space-limited...
2025-04-15
The 145655030000829+T connector is designed as a floating plug with 30 gold-plated pins, a double-row layout, and a pin spacing of only 0.50mm, ensuring the reliability and conductivity of high-densit...
